Lista de obras - Rasmus Havelund - Dominio Público Uruguay

3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling.

artículo científico publicado en 2015

Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study.

artículo científico publicado en 2012

Argon cluster ion source evaluation on lipid standards and rat brain tissue samples

artículo científico publicado en 2013

Chemical Imaging of Buried Interfaces in Organic-Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry

scientific article published on 17 January 2019

Correction to Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study.

artículo científico publicado en 2015

Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size

artículo científico publicado en 2015

Determination of the sputtering yield of cholesterol using Arn(+) and C60(+(+)) cluster ions

artículo científico publicado en 2016

Direct electrospinning of Ag/polyvinylpyrrolidone nanocables

artículo científico publicado en 2011

Electron flood gun damage effects in 3D secondary ion mass spectrometry imaging of organics

article

Embedding-Free Method for Preparation of Cross-Sections of Organic Materials for Micro Chemical Analysis Using Gas Cluster Ion Beam Sputtering.

artículo científico publicado en 2017

Functional electrospun polystyrene nanofibers incorporating α-, β-, and γ-cyclodextrins: comparison of molecular filter performance

artículo científico publicado en 2010

Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing

artículo científico publicado en 2013

Intracellular Drug Uptake-A Comparison of Single Cell Measurements Using ToF-SIMS Imaging and Quantification from Cell Populations with LC/MS/MS.

artículo científico publicado en 2017

Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

artículo científico publicado en 2015

Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion Sources.

artículo científico publicado en 2016

SIMS of Organic Materials-Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions.

artículo científico publicado en 2018

Sampling Depths, Depth Shifts, and Depth Resolutions for Bi(n)(+) Ion Analysis in Argon Gas Cluster Depth Profiles

artículo científico publicado en 2016

Semiempirical Rules To Determine Drug Sensitivity and Ionization Efficiency in Secondary Ion Mass Spectrometry Using a Model Tissue Sample

artículo científico publicado en 2016

Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster Ions.

artículo científico publicado en 2015

Systematic Temperature Effects in the Argon Cluster Ion Sputter Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry

artículo científico publicado en 2016

The 3D OrbiSIMS-label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power.

artículo científico publicado en 2017

The formation and characterization of cyclodextrin functionalized polystyrene nanofibers produced by electrospinning

artículo científico publicado en 2009

Lista de obras de Rasmus Havelund

3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling.

Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study.

Argon cluster ion source evaluation on lipid standards and rat brain tissue samples

Chemical Imaging of Buried Interfaces in Organic-Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry

Correction to Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study.

Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size

Determination of the sputtering yield of cholesterol using Arn(+) and C60(+(+)) cluster ions

Direct electrospinning of Ag/polyvinylpyrrolidone nanocables

Electron flood gun damage effects in 3D secondary ion mass spectrometry imaging of organics

Embedding-Free Method for Preparation of Cross-Sections of Organic Materials for Micro Chemical Analysis Using Gas Cluster Ion Beam Sputtering.

Functional electrospun polystyrene nanofibers incorporating α-, β-, and γ-cyclodextrins: comparison of molecular filter performance

Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing

Intracellular Drug Uptake-A Comparison of Single Cell Measurements Using ToF-SIMS Imaging and Quantification from Cell Populations with LC/MS/MS.

Measuring Compositions in Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

Peptide Fragmentation and Surface Structural Analysis by Means of ToF-SIMS Using Large Cluster Ion Sources.

SIMS of Organic Materials-Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions.

Sampling Depths, Depth Shifts, and Depth Resolutions for Bi(n)(+) Ion Analysis in Argon Gas Cluster Depth Profiles

Semiempirical Rules To Determine Drug Sensitivity and Ionization Efficiency in Secondary Ion Mass Spectrometry Using a Model Tissue Sample

Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster Ions.

Systematic Temperature Effects in the Argon Cluster Ion Sputter Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry

The 3D OrbiSIMS-label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power.

The formation and characterization of cyclodextrin functionalized polystyrene nanofibers produced by electrospinning