$1/f$ Noise in Drain and Gate Current of MOSFETs With High-$k$ Gate Stacks

An algorithm for separating multilevel random telegraph signal from 1/f noise.

artículo científico publicado en 2008

Characterization of an unstable gaussian-reflectivity resonator in a XeCl laser

Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique

Embedded DSP-based telehealth radar system for remote in-door fall detection.

artículo científico publicado en 2014

FPGA-based distributed computing microarchitecture for complex physical dynamics investigation

artículo científico publicado en 2013

IRIDE: Interdisciplinary research infrastructure based on dual electron linacs and lasers

Implications of fin width scaling on variability and reliability of high-k metal gate FinFETs

Ionizing Radiation Effects on Non Volatile Read Only Memory Cells

Least Square Regression Method for Estimating Gas Concentration in an Electronic Nose System ⬇️

artículo científico publicado el 10 de marzo de 2009

On the dc and noise properties of the gate current in epitaxial Ge p-channel metal oxide semiconductor field effect transistors with TiN∕TaN∕HfO2∕SiO2 gate stack

article

Performance of a XeCl laser with super-gaussian reflectivity unstable resonators

Photoluminescence from a soluble semiconducting polymer in waveguide and microcavity configurations

Reconfigurable Implementation of a CNN-UM Platform for Fast Dynamical Systems Simulation

Simulation, Modeling, and Analysis of Soliton Waves Interaction and Propagation in CNN Transmission Lines for Innovative Data Communication and Processing

article

Super‐Gaussian reflectivity unstable resonator for excimer lasers

Threshold Voltage Variability of NROM Memories After Exposure to Ionizing Radiation

Ultrasensitive low noise voltage amplifier for spectral analysis

scientific article published on 01 August 2008

Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs

scholarly article by Debabrata Maji et al published May 2009 in IEEE Transactions on Electron Devices