Lista de obras - David E. Aspnes - Dominio Público Uruguay

Above-band-gap dielectric functions of ZnGeAs2: Ellipsometric measurements and quasiparticle self-consistentGWcalculations

scholarly article in Physical Review B, vol. 83 no. 23, June 2011

Alignment of an optically active biplate compensator

artículo científico publicado en 1971

Analysis of cermet films with large metal packing fractions

artículo científico publicado en 1986

Analytic representation of the dielectric functions of InAsxSb1−x alloys in the parametric model

Anisotropies in the Above—Band-Gap Optical Spectra of Cubic Semiconductors

artículo científico publicado en 1985

Approximate solution of ellipsometric equations for optically biaxial crystals

artículo científico publicado en 1980

Back-reflection Second-harmonic Generation of (111)Si: Theory and Experiment

article

Biatomic steps on (001) silicon surfaces

scientific article published on 01 December 1986

Bond models in linear and nonlinear optics

Bond-specific reaction kinetics during the oxidation of (111) Si: Effect of n-type doping

Chemical-etch-assisted growth of epitaxial zinc oxide

Classical Correlation Model of Resonance Raman Spectroscopy

artículo científico publicado en 2020

Combined direct- and reciprocal-space approach for converting spectra to energy scales with negligible loss of information

Comments on the determination of the absolute alignment of a polarizer

scientific article published on 01 July 1970

Control of the oxidation kinetics of H-terminated (111)Si by using the carrier concentration and the strain: a second-harmonic-generation investigation

Correlation of dopant-induced optical transitions with superconductivity in La2-xSrxCuO4- delta

artículo científico publicado en 1988

Critical Test of the Interaction of Surface Plasmon Resonances with Molecular Vibrational Transitions

scientific article published on 21 February 2020

Detection and analysis of depolarization artifacts in rotating-compensator polarimeters.

artículo científico publicado en 2001

Dielectric functions and interband transitions of In1−xAlxSb alloys

Dielectric functions and interband transitions of InxAl1 − xP alloys

Direct optical measurement of surface dielectric responses: Interrupted growth on (001) GaAs

artículo científico publicado en 1990

Effect of strain on bond-specific reaction kinetics during the oxidation of H-terminated (111) Si

Eliminating white noise in spectra: A generalized maximum-entropy approach

artículo científico publicado en 2022

Ellipsometric study of single-crystal γ-InSe from 1.5 to 9.2 eV

Exciton-dominated Dielectric Function of Atomically Thin MoS2 Films.

artículo científico publicado en 2015

Geometrically exact ellipsometer alignment

scientific article published on 01 May 1971

Grain-size effects in the parallel-band absorption spectrum of aluminum.

artículo científico publicado en 1986

Grating method for determining the absolute angle of incidence of ellipsometric samples in remote locations

artículo científico publicado en 1992

High precision scanning ellipsometer

artículo científico publicado en 1975

Imaging performance of mirror pairs for grazing-incidence applications: a comparison

artículo científico publicado en 1982

Interband transitions and dielectric functions of InGaSb alloys

Kinetic limits of monolayer growth on (001) GaAs by organometallic chemical-vapor deposition

scientific article published on 01 December 1988

Liquid gallium and the eutectic gallium indium (EGaIn) alloy: Dielectric functions from 1.24 to 3.1 eV by electrochemical reduction of surface oxides

scholarly article by Daniel Morales et al published 29 August 2016 in Applied Physics Letters

Measurement and Control of In-Plane Surface Chemistry During Oxidation of H-Terminated (111)Si

Measurement and control of in-plane surface chemistry during the oxidation of H-terminated (111) Si.

artículo científico publicado en 2010

Methods for drift stabilization and photomultiplier linearization for photometric ellipsometers and polarimeters

artículo científico publicado en 1978

Multiple determination of the optical constants of thin-film coating materials: a Rh sequel

artículo científico publicado en 1986

Nondestructive analysis of coated periodic nanostructures from optical data

artículo científico publicado en 2010

Observation of quasidirect transitions in In1-xGaxP/graded GaP (0.58 <= x <= 0.75) alloys near the Gamma -X1 crossover

scientific article published on 01 February 1995

Optical and structural characterization of epitaxial graphene on vicinal 6H-SiC(0001)–Si by spectroscopic ellipsometry, Auger spectroscopy, and STM

Optical anisotropy of YBa2Cu3O7-x

artículo científico publicado en 1988

Optical dielectric response of PdO

scientific article published on 01 December 1992

Optical properties of copper-oxygen planes in superconducting oxides and related materials

artículo científico publicado en 1989

Optical reflectance and electron diffraction studies of molecular-beam-epitaxy growth transients on GaAs(001)

scientific article published on 01 October 1987

Optical response of microscopically rough surfaces

artículo científico publicado en 1990

Optical-standard surfaces of single-crystal silicon for calibrating ellipsometers and reflectometers

artículo científico publicado en 1994

Optimizing precision of rotating-analyzer and rotating-compensator ellipsometers

artículo científico publicado en 2004

Oxygen-deficiency-induced localized optical excitations in YBa2Cu

artículo científico publicado en 1988

Parameterization of the dielectric functions of InGaSb alloys

Plasmonic phenomena in indium tin oxide and ITO-Au hybrid films

artículo científico publicado en 2009

Plasmonics and effective-medium theories

Precision bounds to ellipsometer systems.

artículo científico publicado en 1975

Proximal electromagnetic shear forces

artículo científico publicado en 1999

Quantitative assessment of linear noise-reduction filters for spectroscopy

scientific article published on 01 December 2020

Real-time observation of atomic ordering in (001) In0.53Ga0.47As epitaxial layers

artículo científico publicado en 1995

Reflectance-difference spectroscopy of (001) GaAs surfaces in ultrahigh vacuum

artículo científico publicado en 1992

Roughness Analysis of the Critical Dimension by Using Spectroscopic Ellipsometry

Shallow acceptor complexes in p-type ZnO

article by J. G. Reynolds et al published 15 April 2013 in Applied Physics Letters

Spectroscopic ellipsometry — Past, present, and future

Spectroscopic ellipsometry—A perspective

Surface science at atmospheric pressure: Reconstructions on (001) GaAs in organometallic chemical vapor deposition

artículo científico publicado en 1992

Surface-Induced Optical Anisotropies of Single-Domain (2 x 1) Reconstructed (001) Si and Ge Surfaces

scientific article published on 01 April 1995

Theory of dielectric-function anisotropies of (001) GaAs (2 x 1) surfaces

artículo científico publicado en 1990

Thickness inhomogeneities and growth mechanisms of GaP heteroepitaxy by organometallic chemical vapor deposition

Virtual photoconductivity

scientific article published on 01 August 1989

Lista de obras de David E. Aspnes

Above-band-gap dielectric functions of ZnGeAs2: Ellipsometric measurements and quasiparticle self-consistentGWcalculations

Alignment of an optically active biplate compensator

Analysis of cermet films with large metal packing fractions

Analytic representation of the dielectric functions of InAsxSb1−x alloys in the parametric model

Anisotropies in the Above—Band-Gap Optical Spectra of Cubic Semiconductors

Approximate solution of ellipsometric equations for optically biaxial crystals

Back-reflection Second-harmonic Generation of (111)Si: Theory and Experiment

Biatomic steps on (001) silicon surfaces

Bond models in linear and nonlinear optics

Bond models in linear and nonlinear optics

Bond-specific reaction kinetics during the oxidation of (111) Si: Effect of n-type doping

Chemical-etch-assisted growth of epitaxial zinc oxide

Classical Correlation Model of Resonance Raman Spectroscopy

Combined direct- and reciprocal-space approach for converting spectra to energy scales with negligible loss of information

Comments on the determination of the absolute alignment of a polarizer

Control of the oxidation kinetics of H-terminated (111)Si by using the carrier concentration and the strain: a second-harmonic-generation investigation

Correlation of dopant-induced optical transitions with superconductivity in La2-xSrxCuO4- delta

Critical Test of the Interaction of Surface Plasmon Resonances with Molecular Vibrational Transitions

Detection and analysis of depolarization artifacts in rotating-compensator polarimeters.

Dielectric functions and interband transitions of In1−xAlxSb alloys

Dielectric functions and interband transitions of InxAl1 − xP alloys

Direct optical measurement of surface dielectric responses: Interrupted growth on (001) GaAs

Effect of strain on bond-specific reaction kinetics during the oxidation of H-terminated (111) Si

Eliminating white noise in spectra: A generalized maximum-entropy approach

Ellipsometric study of single-crystal γ-InSe from 1.5 to 9.2 eV

Exciton-dominated Dielectric Function of Atomically Thin MoS2 Films.

Geometrically exact ellipsometer alignment

Grain-size effects in the parallel-band absorption spectrum of aluminum.

Grating method for determining the absolute angle of incidence of ellipsometric samples in remote locations

High precision scanning ellipsometer

Imaging performance of mirror pairs for grazing-incidence applications: a comparison

Interband transitions and dielectric functions of InGaSb alloys

Kinetic limits of monolayer growth on (001) GaAs by organometallic chemical-vapor deposition

Liquid gallium and the eutectic gallium indium (EGaIn) alloy: Dielectric functions from 1.24 to 3.1 eV by electrochemical reduction of surface oxides

Measurement and Control of In-Plane Surface Chemistry During Oxidation of H-Terminated (111)Si

Measurement and control of in-plane surface chemistry during the oxidation of H-terminated (111) Si.

Methods for drift stabilization and photomultiplier linearization for photometric ellipsometers and polarimeters

Multiple determination of the optical constants of thin-film coating materials: a Rh sequel

Nondestructive analysis of coated periodic nanostructures from optical data

Observation of quasidirect transitions in In1-xGaxP/graded GaP (0.58 <= x <= 0.75) alloys near the Gamma -X1 crossover

Optical and structural characterization of epitaxial graphene on vicinal 6H-SiC(0001)–Si by spectroscopic ellipsometry, Auger spectroscopy, and STM

Optical anisotropy of YBa2Cu3O7-x

Optical dielectric response of PdO

Optical properties of copper-oxygen planes in superconducting oxides and related materials

Optical reflectance and electron diffraction studies of molecular-beam-epitaxy growth transients on GaAs(001)

Optical response of microscopically rough surfaces

Optical-standard surfaces of single-crystal silicon for calibrating ellipsometers and reflectometers

Optimizing precision of rotating-analyzer and rotating-compensator ellipsometers

Oxygen-deficiency-induced localized optical excitations in YBa2Cu

Parameterization of the dielectric functions of InGaSb alloys

Plasmonic phenomena in indium tin oxide and ITO-Au hybrid films

Plasmonics and effective-medium theories

Precision bounds to ellipsometer systems.

Proximal electromagnetic shear forces

Quantitative assessment of linear noise-reduction filters for spectroscopy

Real-time observation of atomic ordering in (001) In0.53Ga0.47As epitaxial layers

Reflectance-difference spectroscopy of (001) GaAs surfaces in ultrahigh vacuum

Roughness Analysis of the Critical Dimension by Using Spectroscopic Ellipsometry

Shallow acceptor complexes in p-type ZnO

Spectroscopic ellipsometry — Past, present, and future

Spectroscopic ellipsometry—A perspective

Surface science at atmospheric pressure: Reconstructions on (001) GaAs in organometallic chemical vapor deposition

Surface-Induced Optical Anisotropies of Single-Domain (2 x 1) Reconstructed (001) Si and Ge Surfaces

Theory of dielectric-function anisotropies of (001) GaAs (2 x 1) surfaces

Thickness inhomogeneities and growth mechanisms of GaP heteroepitaxy by organometallic chemical vapor deposition

Virtual photoconductivity