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Combining Anisotropic Etching and PDMS Casting for Three-Dimensional Analysis of Laser Ablation Processes.

artículo científico publicado en 2018

Depth Profiling and Cross-Sectional Laser Ablation Ionization Mass Spectrometry Studies of Through-Silicon-Vias.

artículo científico publicado en 2018

Insights into Laser Ablation Processes of Heterogeneous Samples: Toward Analysis of Through-Silicon-Vias

scientific article published on 11 May 2018

Isotope abundance ratio measurements using femtosecond laser ablation ionization mass spectrometry

scientific article published on 01 December 2020

UV post-ionization laser ablation ionization mass spectrometry for improved nm-depth profiling resolution on Cr/Ni reference standard

scientific article published on 04 April 2020

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