Comparison between 3.3kV 4H-SiC Schottky and bipolar diodes

Gate Oxide Stability of 4H-SiC MOSFETs under On/Off-State Bias-Temperature Stress

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Structural analysis of SiC Schottky diodes failure mechanism under current overload

Study of 4H-SiC JBS Diodes Fabricated with Tungsten Schottky Barrier

Temperature effects on the ruggedness of SiC Schottky diodes under surge current