A structural and mechanical analysis on PVD-grown (Ti,Al)N/Mo multilayers

Benefits of two-dimensional detectors for synchrotron X-ray diffraction studies of thin film mechanical behavior

Characterisation of Ti1−xSixNy nanocomposite films

Combined synchrotron X-ray and image-correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton

Continuous cyclic deformations of a Ni/W film studied by synchrotron X-ray diffraction

article published in 2017

Controlled biaxial deformation of nanostructured W/Cu thin films studied by X-ray diffraction

Controlled nanostructuration of polycrystalline tungsten thin films

Copper coverage effect on tungsten crystallites texture development in W/Cu nanocomposite thin films

article

Correlation Between Processing and Properties of Titanium Oxycarbide, TiCxOy, Thin Films

scholarly article by Ana C. Fernandes et al published April 2007 in Plasma Processes and Polymers

Development of a synchrotron biaxial tensile device for in situ characterization of thin films mechanical response

artículo científico publicado en 2010

Effect of TiAlN PVD coatings on corrosion performance of WC–6%Co

Elastic behaviour of titanium dioxide films on polyimide substrates studied by in situ tensile testing in a X-ray diffractometer

scholarly article by Elza Bontempi et al published February 2010 in Nuclear Instruments & Methods in Physics Research B

Evolution under annealing and nitrogen implantation of the mechanical properties of amorphous carbon films

Machine biaxiale sur la ligne de lumière Diffabs pour l’étude des propriétés mécaniques de films minces déposés sur substrats polymères

Mastering the biaxial stress state in nanometric thin films on flexible substrates

Mechanical Properties of Thin Films and Nanometric Multilayers Using Tensile Testing and Synchrotron X-Ray Diffraction

Mechanical characterization of nanostructured thin films at different scales

Mechanical properties of PVD Al1−xCrxN thin films

Mechanical properties of hard AlCrN-based coated substrates

Microstructure and elastic properties of atomic layer deposited TiO2 anatase thin films

Nano-structuration effect on the mechanical behavior of gold thin films studied by 2D synchrotron x-ray diffraction

Non-equibiaxial deformation of W/Cu nanocomposite thin films on stretchable substrate: Effect of loading path

Phase transition signature on elastic constants in Al1-xCrxNy ternary alloys thin films

Relationship between Nitrogen Content and Mechanical Properties in Al 1-x Cr x N y Thin Films

Residual stresses in AlCrN PVD thin films

Small scale mechanical properties of polycrystalline materials: in situ diffraction studies

Structural and mechanical studies of Fe-Cr thin films deposited by ion-beam sputtering

Structure and Mechanical Properties of AlCrN Thin Films Deposited by Magnetron Sputtering

Study on Young's modulus of thin films on Kapton by microtensile testing combined with dual DIC system

Synchrotron X-ray diffraction experiments with a prototype hybrid pixel detector

article published in 2011

Thermal Residual Stress Relaxation in Sputtered ZnO Film on (100) Si Substrate Studied In Situ by Synchrotron X-Ray Diffraction

Time-Resolved X-Ray Stress Analysis in Multilayered Thin Films during Continuous Loading: Use of 2D Remote Detection

X-ray diffraction analysis of the structure and residual stresses of W/Cu multilayers

X-ray diffraction analysis of thermally-induced stress relaxation in ZnO films deposited by magnetron sputtering on (100) Si substrates

X-ray diffraction study of thermal stress relaxation in ZnO films deposited by magnetron sputtering

article published in 2010

X-ray elastic strain analysis of compressed Au thin film on polymer substrate

X-ray strain analysis in thin films enhanced by 2D detection

Young modulus and Poisson ratio measurements of TiO2 thin films deposited with Atomic Layer Deposition