Lista de obras - Hugh Simons - Dominio Público Uruguay

A High-Temperature-Capacitor Dielectric Based on K 0.5 Na 0.5 NbO 3 -Modified Bi 1/2 Na 1/2 TiO 3 -Bi 1/2 K 1/2 TiO 3

Conceptual Framework for Dislocation-Modified Conductivity in Oxide Ceramics Deconvoluting Mesoscopic Structure, Core, and Space Charge Exemplified for SrTiO3

artículo científico publicado en 2020

Corrigendum: Dark-field X-ray microscopy for multiscale structural characterization

artículo científico publicado en 2015

Dark-field X-ray microscopy for multiscale structural characterization

artículo científico publicado en 2015

Domain fragmentation during cyclic fatigue in 94%(Bi 1/2 Na 1/2 )TiO 3 -6%BaTiO 3

Dual strain mechanisms in a lead-free morphotropic phase boundary ferroelectric.

artículo científico publicado en 2016

Electric-field-induced strain mechanisms in lead-free 94%(Bi1/2Na1/2)TiO3–6%BaTiO3

Full-field hard x-ray microscopy with interdigitated silicon lenses ⬇️

Imaging microstructural dynamics and strain fields in electro-active materials in situ with dark field x-ray microscopy

artículo científico publicado en 2020

Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes

artículo científico publicado en 2020

Injection molded polymeric hard X-ray lenses

Long-range symmetry breaking in embedded ferroelectrics

artículo científico publicado en 2018

Measurement and analysis of field-induced crystallographic texture using curved position-sensitive diffraction detectors

article

Nondestructive Mapping of Long-Range Dislocation Strain Fields in an Epitaxial Complex Metal Oxide

artículo científico publicado en 2019

Optimizing shape uniformity and increasing structure heights of deep reactive ion etched silicon x-ray lenses

Origin of large recoverable strain in 0.94(Bi 0.5 Na 0.5 )TiO 3 -0.06BaTiO 3 near the ferroelectric-relaxor transition

Sacrificial structures for deep reactive ion etching of high-aspect ratio kinoform silicon x-ray lenses

Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics ⬇️

artículo científico publicado en 2016

Temperature dependent polarization reversal mechanism in 0.94(Bi 1/2 Na 1/2 )TiO 3 -0.06Ba(Zr 0.02 Ti 0.98 )O 3 relaxor ceramics

The fractional Fourier transform as a simulation tool for lens-based X-ray microscopy

scientific article published on 05 April 2018

Three-dimensional nanometrology of microstructures by replica molding and large-range atomic force microscopy

Translative lens-based full-field coherent X-ray imaging

artículo científico publicado en 2020

Lista de obras de Hugh Simons

A High-Temperature-Capacitor Dielectric Based on K 0.5 Na 0.5 NbO 3 -Modified Bi 1/2 Na 1/2 TiO 3 -Bi 1/2 K 1/2 TiO 3

Conceptual Framework for Dislocation-Modified Conductivity in Oxide Ceramics Deconvoluting Mesoscopic Structure, Core, and Space Charge Exemplified for SrTiO3

Corrigendum: Dark-field X-ray microscopy for multiscale structural characterization

Dark-field X-ray microscopy for multiscale structural characterization

Domain fragmentation during cyclic fatigue in 94%(Bi 1/2 Na 1/2 )TiO 3 -6%BaTiO 3

Dual strain mechanisms in a lead-free morphotropic phase boundary ferroelectric.

Electric-field-induced strain mechanisms in lead-free 94%(Bi1/2Na1/2)TiO3–6%BaTiO3

Full-field hard x-ray microscopy with interdigitated silicon lenses ⬇️

Imaging microstructural dynamics and strain fields in electro-active materials in situ with dark field x-ray microscopy

Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes

Injection molded polymeric hard X-ray lenses

Long-range symmetry breaking in embedded ferroelectrics

Measurement and analysis of field-induced crystallographic texture using curved position-sensitive diffraction detectors

Nondestructive Mapping of Long-Range Dislocation Strain Fields in an Epitaxial Complex Metal Oxide

Optimizing shape uniformity and increasing structure heights of deep reactive ion etched silicon x-ray lenses

Origin of large recoverable strain in 0.94(Bi 0.5 Na 0.5 )TiO 3 -0.06BaTiO 3 near the ferroelectric-relaxor transition

Sacrificial structures for deep reactive ion etching of high-aspect ratio kinoform silicon x-ray lenses

Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics ⬇️

Temperature dependent polarization reversal mechanism in 0.94(Bi 1/2 Na 1/2 )TiO 3 -0.06Ba(Zr 0.02 Ti 0.98 )O 3 relaxor ceramics

The fractional Fourier transform as a simulation tool for lens-based X-ray microscopy

Three-dimensional nanometrology of microstructures by replica molding and large-range atomic force microscopy

Translative lens-based full-field coherent X-ray imaging