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Lista de obras de Montserrat Nafria

Analysis of Factors in the Nanoscale Physical and Electrical Characterization of High-K Materials by Conductive Atomic Force Microscope

Conductivity and Charge Trapping After Electrical Stress in Amorphous and Polycrystalline $\hbox{Al}_{2}\hbox{O}_{3}\hbox{-Based}$ Devices Studied With AFM-Related Techniques

Current-limiting and ultrafast system for the characterization of resistive random access memories

artículo científico publicado en 2016

Electrical and mechanical performance of graphene sheets exposed to oxidative environments

Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization.

artículo científico publicado en 2012

Investigation of Filamentary Current Fluctuations Features in the High-Resistance State of Ni/HfO2-Based RRAM

Leakage current through the poly-crystalline HfO2: Trap densities at grains and grain boundaries

Low-Power, High-Performance, Non-volatile Inkjet-Printed HfO2-Based Resistive Random Access Memory: From Device to Nanoscale Characterization

scientific article published on 21 June 2019

Nanoscale and Device Level Gate Conduction Variability of High-k Dielectrics-Based Metal-Oxide-Semiconductor Structures

Nanoscale and device level electrical behavior of annealed ALD Hf-based gate oxide stacks grown with different precursors

Nanoscale conductive pattern of the homoepitaxial AlGaN/GaN transistor

artículo científico publicado en 2015

Nanoscale investigation of AlGaN/GaN-on-Si high electron mobility transistors

scientific article published on 12 September 2012

Note: Electrical resolution during conductive atomic force microscopy measurements under different environmental conditions and contact forces

artículo científico publicado en 2010

Numerical Study of Hydrodynamic Forces for AFM Operations in Liquid.

artículo científico publicado en 2017

Polycrystallization effects on the nanoscale electrical properties of high-k dielectrics ⬇️

artículo científico publicado el 31 de enero de 2011

Self-Organizing Neural Networks Based on OxRAM Devices under a Fully Unsupervised Training Scheme

scientific article published on 24 October 2019

Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs

scholarly article by Debabrata Maji et al published May 2009 in IEEE Transactions on Electron Devices

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