An Analytical Model of the Propagation Induced Pulse Broadening (PIPB) Effects on Single Event Transient in Flash-Based FPGAs

Analyzing the Impact of Single-Event-Induced Charge Sharing in Complex Circuits

Analyzing the influence of voltage scaling for soft errors in SRAM-based FPGAs

Constrained Placement Methodology for Reducing SER Under Single-Event-Induced Charge Sharing Effects

article by Luis Entrena et al published August 2012 in IEEE Transactions on Nuclear Science

Constrained placement methodology for reducing SER under single-event-induced charge sharing effects

scholarly article published September 2011

Hybrid soft error mitigation techniques for COTS processor-based systems

Measuring the impact of voltage scaling for soft errors in SRAM-based FPGAs from a designer perspective

On the Optimal Design of Triple Modular Redundancy Logic for SRAM-based FPGAs

Using Benchmarks for Radiation Testing of Microprocessors and FPGAs