Lista de obras - Olivier Thomas - Dominio Público Uruguay

3D strain imaging in sub-micrometer crystals using cross-reciprocal space measurements: Numerical feasibility and experimental methodology

article published in 2010

Comparative study of metallic silicide-germanide orthorhombic MnP systems.

artículo científico publicado en 2013

Concentration and strain fields inside a Ag/Au core-shell nanowire studied by coherent X-ray diffraction

artículo científico publicado en 2013

Cubic local order around Al and intermixing in short-period AlN/TiN multilayers studied by Al K-edge extended x-ray absorption fine structure spectroscopy and x-ray diffraction

Direct Observation of Gigahertz Coherent Guided Acoustic Phonons in Free-Standing Single Copper Nanowires ⬇️

artículo científico publicado en 2014

Direct Observations of the Structural Properties of Semiconducting Polymer: Fullerene Blends under Tensile Stretching

artículo científico publicado en 2020

Finite element simulations of coherent diffraction in elastoplastic polycrystalline aggregates

Imaging the facet surface strain state of supported multi-faceted Pt nanoparticles during reaction

artículo científico publicado en 2022

In situ bending of an Au nanowire monitored by micro Laue diffraction

artículo científico publicado en 2015

In situ three-dimensional reciprocal-space mapping during mechanical deformation.

artículo científico publicado en 2012

Interplay between anisotropic strain relaxation and uniaxial interface magnetic anisotropy in epitaxial Fe films on (001) GaAs

scientific article published on 09 January 2003

Inversion of the diffraction pattern from an inhomogeneously strained crystal using an iterative algorithm

artículo científico publicado en 2007

Local strain in a 3D nano-crystal revealed by 2D coherent X-ray diffraction imaging

article published in 2007

Low-temperature specific heat of MoSi2

artículo científico publicado en 1988

Methodology for studying strain inhomogeneities in polycrystalline thin films duringin situthermal loading using coherent x-ray diffraction

Nanometer scale assessment of mechanical strain induced in silicon by a periodic line array

artículo científico publicado en 2011

Piezoelectric Properties of Pb1-xLax(Zr0.52Ti0.48)1-x/4O3 Thin Films Studied by In Situ X-ray Diffraction

artículo científico publicado en 2020

Pipe-diffusion ripening of Si precipitates in Al-0.5%Cu-1%Si thin films

artículo científico publicado en 2005

Scanning force microscope for in situ nanofocused X-ray diffraction studies

artículo científico publicado en 2014

Simultaneous Multi-Bragg Peak Coherent X-ray Diffraction Imaging

scientific article published in 2021

Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling

artículo científico publicado en 2020

de Haas-van Alphen effect in MoSi2

artículo científico publicado en 1987

Lista de obras de Olivier Thomas

3D strain imaging in sub-micrometer crystals using cross-reciprocal space measurements: Numerical feasibility and experimental methodology

Comparative study of metallic silicide-germanide orthorhombic MnP systems.

Concentration and strain fields inside a Ag/Au core-shell nanowire studied by coherent X-ray diffraction

Cubic local order around Al and intermixing in short-period AlN/TiN multilayers studied by Al K-edge extended x-ray absorption fine structure spectroscopy and x-ray diffraction

Direct Observation of Gigahertz Coherent Guided Acoustic Phonons in Free-Standing Single Copper Nanowires ⬇️

Direct Observations of the Structural Properties of Semiconducting Polymer: Fullerene Blends under Tensile Stretching

Finite element simulations of coherent diffraction in elastoplastic polycrystalline aggregates

Imaging the facet surface strain state of supported multi-faceted Pt nanoparticles during reaction

In situ bending of an Au nanowire monitored by micro Laue diffraction

In situ three-dimensional reciprocal-space mapping during mechanical deformation.

Interplay between anisotropic strain relaxation and uniaxial interface magnetic anisotropy in epitaxial Fe films on (001) GaAs

Inversion of the diffraction pattern from an inhomogeneously strained crystal using an iterative algorithm

Local strain in a 3D nano-crystal revealed by 2D coherent X-ray diffraction imaging

Low-temperature specific heat of MoSi2

Methodology for studying strain inhomogeneities in polycrystalline thin films duringin situthermal loading using coherent x-ray diffraction

Nanometer scale assessment of mechanical strain induced in silicon by a periodic line array

Piezoelectric Properties of Pb1-xLax(Zr0.52Ti0.48)1-x/4O3 Thin Films Studied by In Situ X-ray Diffraction

Pipe-diffusion ripening of Si precipitates in Al-0.5%Cu-1%Si thin films

Scanning force microscope for in situ nanofocused X-ray diffraction studies

Simultaneous Multi-Bragg Peak Coherent X-ray Diffraction Imaging

Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling

de Haas-van Alphen effect in MoSi2