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Lista de obras de A Riedo

Combining Anisotropic Etching and PDMS Casting for Three-Dimensional Analysis of Laser Ablation Processes.

artículo científico publicado en 2018

Depth Profiling and Cross-Sectional Laser Ablation Ionization Mass Spectrometry Studies of Through-Silicon-Vias.

artículo científico publicado en 2018

Detectability of biosignatures in a low-biomass simulation of martian sediments

artículo científico publicado en 2019

EGT-A sensitive time-of-flight mass spectrometer for multielement isotope gas analysis

scientific article published on 01 November 2018

Fully automatic and precise data analysis developed for time-of-flight mass spectrometry

artículo científico publicado en 2017

High-speed microstrip multi-anode multichannel plate detector system

artículo científico publicado en 2017

Improved detection sensitivity for heavy trace elements using a miniature laser ablation ionisation mass spectrometer

Insights into Laser Ablation Processes of Heterogeneous Samples: Toward Analysis of Through-Silicon-Vias

scientific article published on 11 May 2018

Isotope abundance ratio measurements using femtosecond laser ablation ionization mass spectrometry

scientific article published on 01 December 2020

Microbial Markers Profile in Anaerobic Mars Analogue Environments Using the LDChip (Life Detector Chip) Antibody Microarray Core of the SOLID (Signs of Life Detector) Platform

artículo científico publicado en 2019

Three-Dimensional Composition Analysis of SnAg Solder Bumps Using Ultraviolet Femtosecond Laser Ablation Ionization Mass Spectrometry

scientific article published on 20 December 2019

Toward Three-Dimensional Chemical Imaging of Ternary Cu-Sn-Pb Alloys Using Femtosecond Laser Ablation/Ionization Mass Spectrometry

artículo científico publicado en 2017

Towards In-Situ Geochemical Analysis of Planetary Rocks and Soils by Laser Ablation/Ionisation Time-of-Flight Mass Spectrometry

artículo científico publicado en 2022

UV post-ionization laser ablation ionization mass spectrometry for improved nm-depth profiling resolution on Cr/Ni reference standard

scientific article published on 04 April 2020

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